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Nanowire facilitated transfer of sensitive TEM samples in a FIB

Gorji, Saleh ; Kashiwar, Ankush ; Mantha, Lakshmi S. ; Kruk, Robert ; Witte, Ralf ; Marek, Peter ; Hahn, Horst ; Kübel, Christian ; Scherer, Torsten (2020)
Nanowire facilitated transfer of sensitive TEM samples in a FIB.
In: Ultramicroscopy, 219
doi: 10.1016/j.ultramic.2020.113075
Article, Bibliographie

Abstract

We introduce a facile approach to transfer thin films and other mechanically sensitive TEM samples inside a FIB with minimal introduction of stress and bending. The method is making use of a pre-synthetized flexible freestanding Ag nanowire attached to the tip of a typical tungsten micromanipulator inside the FIB. The main advantages of this approach are the significantly reduced stress-induced bending during transfer and attachment of the TEM sample, the very short time required to attach and cut the nanowire, the operation at very low dose and ion current, and only using the e-beam for Pt deposition during the transfer of sensitive TEM samples. This results in a reduced sample preparation time and reduced exposure to the ion beam or e-beam for Pt deposition during the sample preparation and thus also reduced contamination and beam damage. The method was applied to a number of thin films and different TEM samples in order to illustrate the advantageous benefits of the concept. In particular, the technique has been successfully tested for the transfer of a thin film onto a MEMS heating chip for in situ TEM experiments.

Item Type: Article
Erschienen: 2020
Creators: Gorji, Saleh ; Kashiwar, Ankush ; Mantha, Lakshmi S. ; Kruk, Robert ; Witte, Ralf ; Marek, Peter ; Hahn, Horst ; Kübel, Christian ; Scherer, Torsten
Type of entry: Bibliographie
Title: Nanowire facilitated transfer of sensitive TEM samples in a FIB
Language: English
Date: December 2020
Publisher: Elsevier
Journal or Publication Title: Ultramicroscopy
Volume of the journal: 219
DOI: 10.1016/j.ultramic.2020.113075
Abstract:

We introduce a facile approach to transfer thin films and other mechanically sensitive TEM samples inside a FIB with minimal introduction of stress and bending. The method is making use of a pre-synthetized flexible freestanding Ag nanowire attached to the tip of a typical tungsten micromanipulator inside the FIB. The main advantages of this approach are the significantly reduced stress-induced bending during transfer and attachment of the TEM sample, the very short time required to attach and cut the nanowire, the operation at very low dose and ion current, and only using the e-beam for Pt deposition during the transfer of sensitive TEM samples. This results in a reduced sample preparation time and reduced exposure to the ion beam or e-beam for Pt deposition during the sample preparation and thus also reduced contamination and beam damage. The method was applied to a number of thin films and different TEM samples in order to illustrate the advantageous benefits of the concept. In particular, the technique has been successfully tested for the transfer of a thin film onto a MEMS heating chip for in situ TEM experiments.

Uncontrolled Keywords: TEM sample preparation, nanomanipulator, focused ion beam, thin film transfer, Lamellae lift-out, FeRh
Identification Number: Artikel-ID: 113075
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > In-situ electron microscopy
Date Deposited: 12 Jun 2024 07:57
Last Modified: 12 Jun 2024 07:57
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