Peters, Julian ; Zimmerer, Christoph ; Gwosch, Thomas ; Herbst, Felix ; Hartmann, Claas ; Chadda, Romol ; Riehl, David ; Keil, Ferdinand ; Kupnik, Mario ; Hofmann, Klaus ; Matthiesen, Sven (2022)
Test-driven Development to Overcome Challenges in the Design of Sensor-integrating Machine Elements.
33rd Symposium Design for X (DFX2022). Hamburg, Germany (22.09.2022-23.09.2022)
doi: 10.35199/dfx2022.12
Conference or Workshop Item, Bibliographie
Abstract
Sensor-integrating machine elements (SiME) are essential enablers for digitization in the industry. There are major challenges in the development of SiME as an interdisciplinary mechatronic system, requiring methodical support. In this work, we address these challenges and aim to provide methods and tools by analyzing the state-of-the-art and ten ongoing projects of sensor integration in machine elements. Clustering shows similarities for example in the identification of design space or weakening of the structure. Based on this, a test-driven development process with a focus on interdisciplinary negotiations and iterations is described to overcome the challenges in developing SiME.
| Item Type: | Conference or Workshop Item |
|---|---|
| Erschienen: | 2022 |
| Creators: | Peters, Julian ; Zimmerer, Christoph ; Gwosch, Thomas ; Herbst, Felix ; Hartmann, Claas ; Chadda, Romol ; Riehl, David ; Keil, Ferdinand ; Kupnik, Mario ; Hofmann, Klaus ; Matthiesen, Sven |
| Type of entry: | Bibliographie |
| Title: | Test-driven Development to Overcome Challenges in the Design of Sensor-integrating Machine Elements |
| Language: | English |
| Date: | September 2022 |
| Book Title: | DS 119: Proceedings of the 33rd Symposium Design for X (DFX2022) |
| Event Title: | 33rd Symposium Design for X (DFX2022) |
| Event Location: | Hamburg, Germany |
| Event Dates: | 22.09.2022-23.09.2022 |
| DOI: | 10.35199/dfx2022.12 |
| Abstract: | Sensor-integrating machine elements (SiME) are essential enablers for digitization in the industry. There are major challenges in the development of SiME as an interdisciplinary mechatronic system, requiring methodical support. In this work, we address these challenges and aim to provide methods and tools by analyzing the state-of-the-art and ten ongoing projects of sensor integration in machine elements. Clustering shows similarities for example in the identification of design space or weakening of the structure. Based on this, a test-driven development process with a focus on interdisciplinary negotiations and iterations is described to overcome the challenges in developing SiME. |
| Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Measurement and Sensor Technology 18 Department of Electrical Engineering and Information Technology > Institute of Computer Engineering 18 Department of Electrical Engineering and Information Technology > Institute of Computer Engineering > Integrated Electronic Systems (IES) |
| Date Deposited: | 10 Oct 2022 12:50 |
| Last Modified: | 25 Apr 2023 07:37 |
| PPN: | 506469921 |
| Export: | |
| Suche nach Titel in: | TUfind oder in Google |
 |
Send an inquiry |
Options (only for editors)
 |
Show editorial Details |
Drucken
Impressum