Kleebe, H.-J. ; Cinibulk, M. K. (1993)
Transmission Electron-Microscopy Characterization of a Ceria-Fluxed Silicon Nitride.
In: Journal of Materials Science Letters, 12 (2)
doi: 10.1007/BF00241851
Article, Bibliographie
| Item Type: | Article |
|---|---|
| Erschienen: | 1993 |
| Creators: | Kleebe, H.-J. ; Cinibulk, M. K. |
| Type of entry: | Bibliographie |
| Title: | Transmission Electron-Microscopy Characterization of a Ceria-Fluxed Silicon Nitride |
| Language: | English |
| Date: | 1993 |
| Publisher: | Springer |
| Journal or Publication Title: | Journal of Materials Science Letters |
| Volume of the journal: | 12 |
| Issue Number: | 2 |
| DOI: | 10.1007/BF00241851 |
| Divisions: | 11 Department of Materials and Earth Sciences 11 Department of Materials and Earth Sciences > Earth Science 11 Department of Materials and Earth Sciences > Earth Science > Geo-Material-Science |
| Date Deposited: | 17 Nov 2021 12:07 |
| Last Modified: | 17 Nov 2021 12:07 |
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