Vetrano, J. S. ; Kleebe, H.-J. ; Hampp, E. ; Hoffmann, M. J. ; Rühle, M. ; Cannon, R. M. (1993)
Yb2O3-Fluxed Sintered Silicon Nitride, Part 1 Microstructure Characterization.
In: Journal of Materials Science, 28 (13)
doi: 10.1007/bf01159834
Article, Bibliographie
| Item Type: | Article |
|---|---|
| Erschienen: | 1993 |
| Creators: | Vetrano, J. S. ; Kleebe, H.-J. ; Hampp, E. ; Hoffmann, M. J. ; Rühle, M. ; Cannon, R. M. |
| Type of entry: | Bibliographie |
| Title: | Yb2O3-Fluxed Sintered Silicon Nitride, Part 1 Microstructure Characterization |
| Language: | English |
| Date: | 1993 |
| Publisher: | Springer Nature |
| Journal or Publication Title: | Journal of Materials Science |
| Volume of the journal: | 28 |
| Issue Number: | 13 |
| DOI: | 10.1007/bf01159834 |
| Divisions: | 11 Department of Materials and Earth Sciences 11 Department of Materials and Earth Sciences > Earth Science 11 Department of Materials and Earth Sciences > Earth Science > Geo-Material-Science |
| Date Deposited: | 17 Nov 2021 12:07 |
| Last Modified: | 17 Nov 2021 12:07 |
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