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Crystallographic orientation of facets and planar defects in functional nanostructures elucidated by nano-focused coherent diffractive X-ray imaging

Richard, Marie-Ingrid ; Fernández, Sara ; Eymery, Joël ; Hofmann, Jan P. ; Gao, Lu ; Carnis, Jérôme ; Labat, Stéphane ; Favre-Nicolin, Vincent ; Hensen, Emiel J. M. ; Thomas, Olivier ; Schülli, Tobias U. ; Leake, Steven J. (2018):
Crystallographic orientation of facets and planar defects in functional nanostructures elucidated by nano-focused coherent diffractive X-ray imaging.
In: Nanoscale, 10 (10), pp. 4833-4840. ISSN 2040-3364,
DOI: 10.1039/C7NR07990G,
[Article]

Item Type: Article
Erschienen: 2018
Creators: Richard, Marie-Ingrid ; Fernández, Sara ; Eymery, Joël ; Hofmann, Jan P. ; Gao, Lu ; Carnis, Jérôme ; Labat, Stéphane ; Favre-Nicolin, Vincent ; Hensen, Emiel J. M. ; Thomas, Olivier ; Schülli, Tobias U. ; Leake, Steven J.
Title: Crystallographic orientation of facets and planar defects in functional nanostructures elucidated by nano-focused coherent diffractive X-ray imaging
Language: English
Journal or Publication Title: Nanoscale
Volume of the journal: 10
Issue Number: 10
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Surface Science
Date Deposited: 07 Jul 2020 05:32
DOI: 10.1039/C7NR07990G
URL / URN: https://doi.org/10.1039/C7NR07990G
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