Noll, Dennis ; Schwalke, Udo (2019)
Reliability issues and length dependence of nanocrystalline graphene field-effect transistors for gas sensing.
14th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS). (16.-18. April 2019)
doi: 10.1109/DTIS.2019.8734953
Conference or Workshop Item, Bibliographie
| Item Type: | Conference or Workshop Item |
|---|---|
| Erschienen: | 2019 |
| Creators: | Noll, Dennis ; Schwalke, Udo |
| Type of entry: | Bibliographie |
| Title: | Reliability issues and length dependence of nanocrystalline graphene field-effect transistors for gas sensing |
| Language: | English |
| Date: | 16 April 2019 |
| Place of Publication: | Mykonos, Greece |
| Journal or Publication Title: | 2019 14th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS) |
| Event Title: | 14th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS) |
| Event Dates: | 16.-18. April 2019 |
| DOI: | 10.1109/DTIS.2019.8734953 |
| URL / URN: | https://ieeexplore.ieee.org/abstract/document/8734953 |
| Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Institute for Semiconductor Technology and Nano-Electronics |
| Date Deposited: | 30 Jul 2019 09:23 |
| Last Modified: | 30 Jul 2019 09:23 |
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