Noll, Dennis ; Schwalke, Udo (2018)
Yield and Reliability of Nanocrystalline Graphene Field-Effect Gas Sensors.
AiMES 2018 -The Americas International Meeting on Electrochemistry and Solid State Science. Cancun, Mexico (30.09.-04.10.2018)
doi: 10.1149/08609.0041ecst
Conference or Workshop Item, Bibliographie
| Item Type: | Conference or Workshop Item |
|---|---|
| Erschienen: | 2018 |
| Creators: | Noll, Dennis ; Schwalke, Udo |
| Type of entry: | Bibliographie |
| Title: | Yield and Reliability of Nanocrystalline Graphene Field-Effect Gas Sensors |
| Language: | English |
| Date: | 2018 |
| Journal or Publication Title: | ECS Transactions, 86 (9) pp. 41 - 49 |
| Event Title: | AiMES 2018 -The Americas International Meeting on Electrochemistry and Solid State Science |
| Event Location: | Cancun, Mexico |
| Event Dates: | 30.09.-04.10.2018 |
| DOI: | 10.1149/08609.0041ecst |
| URL / URN: | http://ecst.ecsdl.org/content/86/9/41.abstract?sid=1c3d40c0-... |
| Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Institute for Semiconductor Technology and Nano-Electronics |
| Date Deposited: | 30 Jul 2019 09:34 |
| Last Modified: | 22 Jul 2020 14:43 |
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