Noll, Dennis ; Schwalke, Udo (2016)
Investigation of Transfer-free Catalytic CVD Graphene on SiO2 by Means of Conductive Atomic Force Microscopy.
11th International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS). Istanbul, Turkey (12.04.2016-14.04.2016)
doi: 10.1109/DTIS.2016.7483899
Conference or Workshop Item, Bibliographie
URL / URN: https://ieeexplore.ieee.org/document/7483899
| Item Type: | Conference or Workshop Item |
|---|---|
| Erschienen: | 2016 |
| Creators: | Noll, Dennis ; Schwalke, Udo |
| Type of entry: | Bibliographie |
| Title: | Investigation of Transfer-free Catalytic CVD Graphene on SiO2 by Means of Conductive Atomic Force Microscopy |
| Language: | English |
| Date: | 2016 |
| Place of Publication: | Istanbul, Turkey |
| Event Title: | 11th International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS) |
| Event Location: | Istanbul, Turkey |
| Event Dates: | 12.04.2016-14.04.2016 |
| DOI: | 10.1109/DTIS.2016.7483899 |
| URL / URN: | https://ieeexplore.ieee.org/document/7483899 |
| Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Institute for Semiconductor Technology and Nano-Electronics |
| Date Deposited: | 30 Jul 2019 09:33 |
| Last Modified: | 30 Jul 2019 09:33 |
| PPN: | |
| Export: | |
| Suche nach Titel in: | TUfind oder in Google |
 |
Send an inquiry |
Options (only for editors)
 |
Show editorial Details |
Drucken
Impressum