Hajo, A. S. ; Yilmazoglu, O. ; Küppers, F. ; Dadgar, A. (2018):
Reliability Improvement of High-Power THz GaN Gunn Sources for Active Imaging Systems.
pp. 1-2, 2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), ISSN 2162-2035,
DOI: 10.1109/IRMMW-THz.2018.8510363,
[Conference or Workshop Item]
| Item Type: | Conference or Workshop Item |
|---|---|
| Erschienen: | 2018 |
| Creators: | Hajo, A. S. ; Yilmazoglu, O. ; Küppers, F. ; Dadgar, A. |
| Title: | Reliability Improvement of High-Power THz GaN Gunn Sources for Active Imaging Systems |
| Language: | English |
| Uncontrolled Keywords: | gallium compounds;Gunn diodes;heat sinks;III-V semiconductors;terahertz wave imaging;wide band gap semiconductors;higher output power;high diode current;field plate technology;heat sink;THz Gunn source;active imaging systems;reliability improvement;voltage 32.0 V;current 1.5 A;GaN;Gallium nitride;Power generation;Substrates;Reliability;Imaging;Heat sinks;Terahertz radiation |
| Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Institute for Microwave Engineering and Photonics (IMP) > Photonics and Optical Communications 18 Department of Electrical Engineering and Information Technology > Institute for Microwave Engineering and Photonics (IMP) |
| Event Title: | 2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) |
| Date Deposited: | 21 May 2019 11:13 |
| DOI: | 10.1109/IRMMW-THz.2018.8510363 |
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