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Strasi­k, I. and Chetvertkova, V. and Mustafin, E. and Pavlovic, M. and Belousov, A. (2012):
Depth profiling of residual activity of 237U fragments as a range verification technique for 238U primary ion beam.
In: Physical Review Special Topics - Accelerators and Beams, American Physical Society, pp. 071001-1, 15, (7), [Online-Edition: http://link.aps.org/doi/10.1103/PhysRevSTAB.15.071001],
[Article]

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