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Sternemann, C. and Soininen, J. A. and Volmer, M. and Hohl, Achim and Vankó, G. and Streit, S. and Tolan, M. (2005):
X-ray Raman scattering at the Si L II,III-edge of bulk amorphous SiO.
In: Journal of physics and chemistry of solids, 66. pp. 2277-2280, [Article]

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