Artikel

Jamitzky, F. ; Stark, M. ; Bunk, W. ; Heckl, W. M. ; Stark, R. W. (2006)
Chaos in dynamic atomic force microscopy.
In: Nanotechnology, 17 (7)
doi: 10.1088/0957-4484/17/7/S19
Artikel, Bibliographie

Stark, M. ; Guckenberger, R. ; Stemmer, A. ; Stark, R. W. (2005)
Estimating the transfer function of the cantilever in atomic force microscopy: a system identification approach.
In: Journal of Applied Physics, 98 (11)
doi: 10.1063/1.2137887
Artikel, Bibliographie

Stark, R. W. ; Schitter, G. ; Stark, M. ; Guckenberger, R. ; Stemmer, A. (2004)
State space model of freely vibrating and surface-coupled cantilever dynamics in atomic force microscopy.
In: Physical Review B, 69 (8)
doi: 10.1103/PhysRevB.69.085412
Artikel, Bibliographie

Stark, M. ; Stark, R. W. ; Heckl, Wolfgang M. ; Guckenberger, R. (2002)
Inverting dynamic force microscopy: From signals to time-resolved interaction forces.
In: Proceedings of the National Academy of Sciences of the United States of America (PNAS), 99 (13)
doi: 10.1073/pnas.122040599
Artikel, Bibliographie

Stark, M. ; Stark, R. W. ; Heckl, W. M. ; Guckenberger, R. (2000)
Spectroscopy of the anharmonic cantilever oscillations in tapping-mode atomic force microscopy.
In: Applied Physics Letters, 77 (20)
doi: 10.1063/1.1325404
Artikel, Bibliographie

Buchkapitel

Stark, R. W. ; Stark, M.
Hrsg.: Sattler, K. (2010)
Quantitative dynamic atomic force microscopy.
In: Handbook of Nanophysics
Buchkapitel, Bibliographie

Stark, R. W. ; Stark, M.
Hrsg.: Bhushan, B. ; Fuchs, H. (2006)
Higher harmonics in dynamic atomic force microscopy.
In: Applied Scanning Probe Methods II
Buchkapitel, Bibliographie

Konferenzveröffentlichung

Jamitzky, F. ; Stark, M. ; Bunk, W. ; Heckl, W. M. ; Stark, R. W. (2004)
Nonlinear dynamics of a microcantilever in close proximity to a surface.
Proc. 2004 4th IEEE Conf. Nanotechnology. Munich, Germany (17.-19. Aug)
Konferenzveröffentlichung, Bibliographie

Stark, M. ; Guckenberger, R. ; Stemmer, A. ; Stark, R. W. (2004)
Estimation of the transfer function of a microcantilever used in atomic-force microscopy.
Proc. 2004 4th IEEE Conf. Nanotechnology. Munich, Germany (17.-19. Aug)
Konferenzveröffentlichung, Bibliographie

Stark, R. W. ; Schitter, G. ; Stark, M. ; Guckenberger, R. ; Stemmer, A. (2004)
Towards time-resolved dynamic atomic force microscopy: A state space model for the AFM.
Acoustical Imaging.
Konferenzveröffentlichung, Bibliographie