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Schmiedgen, M. and Baretzky, and Schminke, and Schmidt, (1997):
X-ray photoelectron spectroscopy characterization of ion-implanted Ti6Al4V.
Chichester, Wiley, In: European Conference on Application of Surface and Interface Analysis <7, 1997>: Proceedings. Hrsg.: I. Olefjord (u.a.) S. 143-146, [Conference or Workshop Item]

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