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Article

Gottwald, P. and Riemenschneider, and Szentpali, and Hartnagel, and Kincses, and Ruszinko, (1995):
Comparison of photo- and plasma-assisted passivating process effects on GaAs devices by means of low-frequency noise measurements.
In: Solid state electronics. 38 (1995), Nr. 2, S. 413-417, [Article]

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