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Number of items: 15.

English

Tanaka, I. ; Kleebe, H.-J. ; Cinibulk, M. K. ; Bruley, J. ; Clarke, D. R. ; Rühle, M. (2005):
Calcium-Concentration Dependence of the Intergranular Film Thickness in Silicon-Nitride.
In: Journal of the American Ceramic Society, 77 (4), pp. 911-914. ACS, DOI: 10.1111/j.1151-2916.1994.tb07246.x,
[Article]

Tanaka, I. ; Igashira, K. ; Kleebe, H.-J. ; Rühle, M. (2005):
High-Temperature Strength of Fluorine-Doped Silicon-Nitride.
In: Journal of the American Ceramic Society, 77 (1), pp. 275-277. ACS, DOI: 10.1111/j.1151-2916.1994.tb06990.x,
[Article]

Kleebe, H.-J. ; Cinibulk, M. K. ; Cannon, R. M. ; Rühle, M. (2005):
Statistical-Analysis of the Intergranular Film Thickness In Silicon-Nitride Ceramics.
In: Journal of the American Ceramic Society, 76 (8), pp. 1969-1977. ACS, DOI: 10.1111/j.1151-2916.1993.tb08319.x,
[Article]

Diemer, Matthias ; Hoffman, Mark ; Neubrand, Achim ; Rödel, Jürgen ; Müllejans, H. ; Rühle, M. (1997):
The role of oxygen partial presure on the wetting behaviour and the interface chemistry of copper-alumina interfaces.
In: Joining Ceramics, Glass and Metals: International Conference <5, 1997>; Proceedings. S. 1-235, [Conference or Workshop Item]

Prielipp, Helge ; Knechtel, Mathias ; Claussen, Nils ; Streiffer, S. K. ; Müllejans, H. ; Rühle, M. ; Rödel, Jürgen (1995):
Strength and fracture toughness of a aluminum/alumina composites with interpenetrating networks.
197, In: Materials science and engineering. A, (1), pp. 19-30. [Article]

Kaplan, Wayne D. ; Müllejans, H. ; Rühle, M. ; Rödel, Jürgen ; Claussen, Nils (1995):
Ca segregation to basal surface in Alpha-alumina.
78, In: Journal of the American Ceramical Society. 78 (1995), No. 10, S. 2841-2844, (10), pp. 2841-2844. [Article]

Mayer, J. ; Szabó, V. ; Rühle, M. ; Seher, M. ; Riedel, R. (1995):
Polymer-derived Si-based bulk ceramics, Part II: microstructural charcterization by electron spectroscopic imaging.
15, In: Journal of the European Ceramic Society, (8), p. 717. Elsevier Science Ltd, England, ISSN 09552219,
[Article]

Bruley, J. ; Tanaka, I. ; Kleebe, H.-J. ; Rühle, M. (1994):
Chemistry of Grain-Boundaries in Calcia Doped Silicon-Nitride Studied by Spatially-Resolved Electron Energy-Loss Spectroscopy.
In: Analytica Chimica Acta, 297 (1-2), pp. 97-108. Elsevier, DOI: 10.1016/0003-2670(94)00058-1,
[Article]

Kleebe, H.-J. ; Bruley, J. ; Rühle, M. (1994):
HREM and AEM Studies of Yb2O3-Fluxed Silicon-Nitride Ceramics With and Without Cao Addition.
In: Journal of the European Ceramic Society, 14 (1), pp. 1-11. Elsevier, DOI: 10.1016/0955-2219(94)90038-8,
[Article]

Bruley, J. ; Höche, T. ; Kleebe, H.-J. ; Rühle, M. (1994):
Recent Attempts to Detect Magnesium in a Heavily Doped Sapphire Bicrystal by Spatially Resolved Electron Energy--Loss Spectroscopy.
In: Journal of the American Ceramic Society, 77 (9), pp. 2273-2276. ACS, DOI: 10.1111/j.1151-2916.1994.tb04593.x,
[Article]

Höche, T. ; Kenway, P. R. ; Kleebe, H.-J. ; Rühle, M. ; Morris, P. A. (1994):
The Structure of Special Grain-Boundaries in \textgreeka-Al2O3.
In: Journal of Physics and Chemistry of Solids, 55 (10), pp. 1067-1082. Elsevier, DOI: 10.1016/0022-3697(94)90125-2,
[Article]

Cinibulk, M. K. ; Kleebe, H.-J. ; Schneider, G. A. ; Rühle, M. (1993):
Amorphous Intergranular Films in Silicon-Nitride Ceramics Quenched from High-Temperatures.
In: Journal of the American Ceramic Society, 76 (11), pp. 2801-2808. ACS, DOI: 10.1111/j.1151-2916.1993.tb04019.x;,
[Article]

Cinibulk, M. K. ; Kleebe, H.-J. ; Rühle, M. (1993):
Quantitative Comparison of TEM Techniques for Determining Amorphous Intergranular Film Thickness.
In: Journal of the American Ceramic Society, 76 (2), pp. 426-432. ACS, DOI: 10.1111/j.1151-2916.1993.tb03801.x,
[Article]

Vetrano, J. S. ; Kleebe, H.-J. ; Hampp, E. ; Hoffmann, M. J. ; Rühle, M. ; Cannon, R. M. (1993):
Yb2O3-Fluxed Sintered Silicon Nitride, Part 1 Microstructure Characterization.
In: Journal of Materials Science, 28 (13), pp. 3529-3538. Springer Nature, DOI: 10.1007/bf01159834,
[Article]

Kleebe, H.-J. ; Hoffmann, M. J. ; Rühle, M. (1992):
Influence of Secondary Phase Chemistry on Grain-Boundary Film Thickness in Silicon-Nitride.
In: International Journal of Materials Research = Zeitschrift für Metallkunde, 83 (8), pp. 610-617. de Gruyter, DOI: 10.1515/ijmr-1992-830808,
[Article]

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