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Gottwald, P. ; Kräutle, H. ; Szentpali, B. ; Hartnagel, H. L. (2001):
Results on passivation of InP by photo-CVD SiO2 and SiNx obtained by using the low-frequency noise measurement technique.
1, In: Fluctuation and noise letters, pp. S. L35-L43. [Article]

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