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Kaiser, G. and Meyer, and Frieß, and Riedel, and Harris, and Jacob, and Tölg, (1995):
Critical comparison of ICP-OES, XRF, and fluorine volatilization-FTIR spectrometry for the reliable determination of the silicon main constituent in ceramic materials.
In: Fresenius' journal of analystical chemistry. 352 (1995), S. 318-326, [Article]

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