TU Darmstadt / ULB / TUbiblio

Browse by Person

Up a level
Export as [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0
Group by: No Grouping | Item Type | Date | Language
Jump to: English
Number of items: 1.


Manca, J. ; Croes, K. ; De Ceuninck, W. ; De Schepper, L. ; Dieval, B. ; Hartnagel, H. L.
Papanicolaou, Nick (ed.) Naval Research Laboratory (Corporate Creator) (2000):
High temperature time dependent dielectric breakdown of power MOSFETs.
In: Reliabiblity, lifetime and testing : session V, pp. o. A., [Book Section]

This list was generated on Sat Dec 4 06:26:38 2021 CET.