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Conference or Workshop Item

Sydlo, Cezary and Mottet, B. and Ganis, H. and Hartnagel, H. L. and Krozer, V. and Delage, S. L. and Cassette, S. and Chartier, E. and Floriot, D. (2001):
Defect detection and modelling using pulsed electrical stress for reliability investigations of InGaP HBT.
In: ESREF 2001: European Symposium on Reliability of Electron Devices <12, 2001, Arcachon>: Conference proceedings. Vol. 1, S. 1567-1571. - Oxford : Pergamon, 2001, Oxford, Pergamon, [Conference or Workshop Item]

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