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Steinborn, T. ; Adrian, ; Brecht, ; Fuess, ; Maul, ; Miehe, ; Petersen, ; Rao, ; Schmahl, :
Orientational changes in the a-b plane of YBa2Cu3O7-beta films on different substrates.
In: Journal of applied crystallography. 29 (1996), S. 125-133
[Artikel], (1996)

Steinborn, T. ; Fuess, ; Adrian, :
Two methods of expanding the measurement abilities of a four-circle diffractometer.
In: Journal of applied crystallography. 29 (1996), S. 604-606
[Artikel], (1996)