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Field emission characterization of in-situ deposited metallic nanocones

Bieker, Johannes and Roustaie, Farough and Schlaak, Helmut F. and Langer, Christoph and Schreiner, Rupert (2017):
Field emission characterization of in-situ deposited metallic nanocones.
In: 30th International Vacuum Nanoelectronics Conference (IVNC), Regensburg, Germany, 10.07.2017, DOI: 10.1109/IVNC.2017.8051571, [Conference or Workshop Item]

Abstract

An in-situ fabrication technique based on ion track etched template electrodeposition of metallic nanocones was used for the production of field emitter cathodes. Gold nanocones with a height of 24 microns, a base diameter between 3 to 4 microns and a tip diameter below 300 nanometers were deposited on a circular electrode with a diameter of 2.5 mm. The integral field emission (FE) measurements of samples with cone densities of 6 · 10^4 cones/cm2 (sample A) and 1 · 10^6 cones/cm2 (sample B) yielded in a maximum current of 37.5 μA at an applied field of 12.5 V/μm for sample A and 29.1 μA at 9.4 V/μm for sample B. The stability of emission current was investigated for over 48 hours and no degradation was observed.

Item Type: Conference or Workshop Item
Erschienen: 2017
Creators: Bieker, Johannes and Roustaie, Farough and Schlaak, Helmut F. and Langer, Christoph and Schreiner, Rupert
Title: Field emission characterization of in-situ deposited metallic nanocones
Language: English
Abstract:

An in-situ fabrication technique based on ion track etched template electrodeposition of metallic nanocones was used for the production of field emitter cathodes. Gold nanocones with a height of 24 microns, a base diameter between 3 to 4 microns and a tip diameter below 300 nanometers were deposited on a circular electrode with a diameter of 2.5 mm. The integral field emission (FE) measurements of samples with cone densities of 6 · 10^4 cones/cm2 (sample A) and 1 · 10^6 cones/cm2 (sample B) yielded in a maximum current of 37.5 μA at an applied field of 12.5 V/μm for sample A and 29.1 μA at 9.4 V/μm for sample B. The stability of emission current was investigated for over 48 hours and no degradation was observed.

Divisions: 18 Department of Electrical Engineering and Information Technology > Institute for Electromechanical Design
18 Department of Electrical Engineering and Information Technology > Institute for Electromechanical Design > Microtechnology and Electromechanical Systems
18 Department of Electrical Engineering and Information Technology
Event Title: 30th International Vacuum Nanoelectronics Conference (IVNC)
Event Location: Regensburg, Germany
Event Dates: 10.07.2017
Date Deposited: 14 Dec 2017 19:49
DOI: 10.1109/IVNC.2017.8051571
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