Bieker, Johannes ; Roustaie, Farough ; Schlaak, Helmut F. ; Langer, Christoph ; Schreiner, Rupert (2017)
Field emission characterization of in-situ deposited metallic nanocones.
30th International Vacuum Nanoelectronics Conference (IVNC). Regensburg, Germany (10.07.2017)
doi: 10.1109/IVNC.2017.8051571
Konferenzveröffentlichung, Bibliographie
Kurzbeschreibung (Abstract)
An in-situ fabrication technique based on ion track etched template electrodeposition of metallic nanocones was used for the production of field emitter cathodes. Gold nanocones with a height of 24 microns, a base diameter between 3 to 4 microns and a tip diameter below 300 nanometers were deposited on a circular electrode with a diameter of 2.5 mm. The integral field emission (FE) measurements of samples with cone densities of 6 · 10^4 cones/cm2 (sample A) and 1 · 10^6 cones/cm2 (sample B) yielded in a maximum current of 37.5 μA at an applied field of 12.5 V/μm for sample A and 29.1 μA at 9.4 V/μm for sample B. The stability of emission current was investigated for over 48 hours and no degradation was observed.
| Typ des Eintrags: | Konferenzveröffentlichung |
|---|---|
| Erschienen: | 2017 |
| Autor(en): | Bieker, Johannes ; Roustaie, Farough ; Schlaak, Helmut F. ; Langer, Christoph ; Schreiner, Rupert |
| Art des Eintrags: | Bibliographie |
| Titel: | Field emission characterization of in-situ deposited metallic nanocones |
| Sprache: | Englisch |
| Publikationsjahr: | 10 Juli 2017 |
| Veranstaltungstitel: | 30th International Vacuum Nanoelectronics Conference (IVNC) |
| Veranstaltungsort: | Regensburg, Germany |
| Veranstaltungsdatum: | 10.07.2017 |
| DOI: | 10.1109/IVNC.2017.8051571 |
| Kurzbeschreibung (Abstract): | An in-situ fabrication technique based on ion track etched template electrodeposition of metallic nanocones was used for the production of field emitter cathodes. Gold nanocones with a height of 24 microns, a base diameter between 3 to 4 microns and a tip diameter below 300 nanometers were deposited on a circular electrode with a diameter of 2.5 mm. The integral field emission (FE) measurements of samples with cone densities of 6 · 10^4 cones/cm2 (sample A) and 1 · 10^6 cones/cm2 (sample B) yielded in a maximum current of 37.5 μA at an applied field of 12.5 V/μm for sample A and 29.1 μA at 9.4 V/μm for sample B. The stability of emission current was investigated for over 48 hours and no degradation was observed. |
| Fachbereich(e)/-gebiet(e): | 18 Fachbereich Elektrotechnik und Informationstechnik > Institut für Elektromechanische Konstruktionen (aufgelöst 18.12.2018) 18 Fachbereich Elektrotechnik und Informationstechnik > Mikrotechnik und Elektromechanische Systeme 18 Fachbereich Elektrotechnik und Informationstechnik |
| Hinterlegungsdatum: | 14 Dez 2017 19:49 |
| Letzte Änderung: | 14 Dez 2017 19:49 |
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