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Reversible Cu deintercalation on layered chalcogenide surfaces with scanning probe techniques: Towards nanometer scale storage devices

Jiang, L. and Jaegermann, W. and Pettenkofer, C. and Tomm, Y. and Iyoda, T. and Hashimoto, K. and Fujishima, A. (1997):
Reversible Cu deintercalation on layered chalcogenide surfaces with scanning probe techniques: Towards nanometer scale storage devices.
In: Advanced Materials, 9pp. 578-581, ISSN 09359648,
[Article]

Item Type: Article
Erschienen: 1997
Creators: Jiang, L. and Jaegermann, W. and Pettenkofer, C. and Tomm, Y. and Iyoda, T. and Hashimoto, K. and Fujishima, A.
Title: Reversible Cu deintercalation on layered chalcogenide surfaces with scanning probe techniques: Towards nanometer scale storage devices
Language: English
Journal or Publication Title: Advanced Materials
Volume: 9
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Surface Science
Date Deposited: 19 Nov 2008 16:04
License: [undefiniert]
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