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Characterisation of degradation mechanisms in resonant tunneling diodes

Vogt, Alexander ; Brandt, ; Sigurdardottir, A. ; Schüßler, ; Pena, ; Simon, ; Hartnagel, H. L. ; Rodewald, ; Roesner, (1997):
Characterisation of degradation mechanisms in resonant tunneling diodes.
In: European Symposium of Electron Devices, Failure Physics and Analysis <8, 1997, Arcachon, France>: Proceedings. S. 1691-1694, [Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 1997
Creators: Vogt, Alexander ; Brandt, ; Sigurdardottir, A. ; Schüßler, ; Pena, ; Simon, ; Hartnagel, H. L. ; Rodewald, ; Roesner,
Title: Characterisation of degradation mechanisms in resonant tunneling diodes
Language: English
Series Name: European Symposium of Electron Devices, Failure Physics and Analysis <8, 1997, Arcachon, France>: Proceedings. S. 1691-1694
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Microwave Electronics
Date Deposited: 19 Nov 2008 16:04
License: [undefiniert]
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