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Characterisation of degradation mechanisms in resonant tunneling diodes

Vogt, Alexander and Brandt, and Sigurdardottir, A. and Schüßler, and Pena, and Simon, and Hartnagel, H. L. and Rodewald, and Roesner, (1997):
Characterisation of degradation mechanisms in resonant tunneling diodes.
In: European Symposium of Electron Devices, Failure Physics and Analysis <8, 1997, Arcachon, France>: Proceedings. S. 1691-1694, [Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 1997
Creators: Vogt, Alexander and Brandt, and Sigurdardottir, A. and Schüßler, and Pena, and Simon, and Hartnagel, H. L. and Rodewald, and Roesner,
Title: Characterisation of degradation mechanisms in resonant tunneling diodes
Language: English
Series Name: European Symposium of Electron Devices, Failure Physics and Analysis <8, 1997, Arcachon, France>: Proceedings. S. 1691-1694
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Microwave Electronics
Date Deposited: 19 Nov 2008 16:04
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