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Determination of crystalline perfection and lattice-mismatch between gallium antimonide epitaxial films and gallium arsenide substrates

Goswami, S. N. N. and Lal, and Vogt, and Hartnagel, (1997):
Determination of crystalline perfection and lattice-mismatch between gallium antimonide epitaxial films and gallium arsenide substrates.
In: International Workshop on Physics of Semiconductor Devices <1997, New Delhi>: Proceedings, [Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 1997
Creators: Goswami, S. N. N. and Lal, and Vogt, and Hartnagel,
Title: Determination of crystalline perfection and lattice-mismatch between gallium antimonide epitaxial films and gallium arsenide substrates
Language: English
Series Name: International Workshop on Physics of Semiconductor Devices <1997, New Delhi>: Proceedings
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Microwave Electronics
Date Deposited: 19 Nov 2008 16:04
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