Goswami, S. N. N. ; Lal, ; Vogt, ; Hartnagel, (1997):
Determination of crystalline perfection and lattice-mismatch between gallium antimonide epitaxial films and gallium arsenide substrates.
In: International Workshop on Physics of Semiconductor Devices <1997, New Delhi>: Proceedings, [Conference or Workshop Item]
| Item Type: | Conference or Workshop Item |
|---|---|
| Erschienen: | 1997 |
| Creators: | Goswami, S. N. N. ; Lal, ; Vogt, ; Hartnagel, |
| Title: | Determination of crystalline perfection and lattice-mismatch between gallium antimonide epitaxial films and gallium arsenide substrates |
| Language: | English |
| Series: | International Workshop on Physics of Semiconductor Devices <1997, New Delhi>: Proceedings |
| Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Microwave Electronics |
| Date Deposited: | 19 Nov 2008 16:04 |
| License: | [undefiniert] |
| Export: | |
| Suche nach Titel in: | TUfind oder in Google |
 |
Send an inquiry |
Options (only for editors)
 |
Show editorial Details |
Drucken
Impressum