Goswami, S. N. N. and Lal, and Vogt, and Hartnagel, (1997):
Determination of crystalline perfection and lattice-mismatch between gallium antimonide epitaxial films and gallium arsenide substrates.
In: International Workshop on Physics of Semiconductor Devices <1997, New Delhi>: Proceedings, [Conference or Workshop Item]
| Item Type: | Conference or Workshop Item |
|---|---|
| Erschienen: | 1997 |
| Creators: | Goswami, S. N. N. and Lal, and Vogt, and Hartnagel, |
| Title: | Determination of crystalline perfection and lattice-mismatch between gallium antimonide epitaxial films and gallium arsenide substrates |
| Language: | English |
| Series Name: | International Workshop on Physics of Semiconductor Devices <1997, New Delhi>: Proceedings |
| Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Microwave Electronics |
| Date Deposited: | 19 Nov 2008 16:04 |
| License: | [undefiniert] |
| Export: | |
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