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Comparison of Large Area and Lumped Element Field-Effect Transistors for Broadband Detection of Terahertz

Regensburger, Stefan and Lu, Hong and Gossard, Arthur C. and Preu, Sascha (2017):
Comparison of Large Area and Lumped Element Field-Effect Transistors for Broadband Detection of Terahertz.
In: IRMMW-THz 2017, Cancun, Mexiko, 2017-08-28, DOI: 10.1109/IRMMW-THz.2017.8066960,
[Online-Edition: http://www.tsys.tu-darmstadt.de/media/tss/texte/IRMMW-THz201...],
[Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 2017
Creators: Regensburger, Stefan and Lu, Hong and Gossard, Arthur C. and Preu, Sascha
Title: Comparison of Large Area and Lumped Element Field-Effect Transistors for Broadband Detection of Terahertz
Language: English
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Institute for Microwave Engineering and Photonics
18 Department of Electrical Engineering and Information Technology > Institute for Microwave Engineering and Photonics > Terahertz Systems Technology
Event Title: IRMMW-THz 2017
Event Location: Cancun, Mexiko
Event Dates: 2017-08-28
Date Deposited: 17 Oct 2017 15:22
DOI: 10.1109/IRMMW-THz.2017.8066960
Official URL: http://www.tsys.tu-darmstadt.de/media/tss/texte/IRMMW-THz201...
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