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Surface Cation Segregation and its Effect on the Oxygen Reduction Reaction on Mixed Conducting Electrodes Investigated by ToF-SIMS and ICP-OES

Kubicek, Markus and Limbeck, A. and Frömling, Till and Hutter, H. and Fleig, J. (2011):
Surface Cation Segregation and its Effect on the Oxygen Reduction Reaction on Mixed Conducting Electrodes Investigated by ToF-SIMS and ICP-OES.
In: The Electrochemical Society, ECS, pp. 1975-1983, 35, (1), [Article]

Abstract

La0.6Sr0.4CoO3-δ (LSC) thin film electrodes on yttria stabilized zirconia (YSZ) were investigated by impedance spectroscopy, inductively coupled plasma optical emission spectrometry (ICP-OES) and time of flight secondary ion mass spectrometry (ToF-SIMS). Effects caused by different film deposition temperatures, thermal annealing and chemical etching were studied. Correlations between changes in electrode polarization resistance of oxygen reduction and surface composition were found. The surface cation composition was analyzed by ToF-SIMS and ICP-OES measurements of in situ etched LSC films allowing depth resolved compositional analysis with nominally sub nm resolution. High resolution scanning electron microscopy images illustrate changes in surface morphology.

Item Type: Article
Erschienen: 2011
Creators: Kubicek, Markus and Limbeck, A. and Frömling, Till and Hutter, H. and Fleig, J.
Title: Surface Cation Segregation and its Effect on the Oxygen Reduction Reaction on Mixed Conducting Electrodes Investigated by ToF-SIMS and ICP-OES
Language: English
Abstract:

La0.6Sr0.4CoO3-δ (LSC) thin film electrodes on yttria stabilized zirconia (YSZ) were investigated by impedance spectroscopy, inductively coupled plasma optical emission spectrometry (ICP-OES) and time of flight secondary ion mass spectrometry (ToF-SIMS). Effects caused by different film deposition temperatures, thermal annealing and chemical etching were studied. Correlations between changes in electrode polarization resistance of oxygen reduction and surface composition were found. The surface cation composition was analyzed by ToF-SIMS and ICP-OES measurements of in situ etched LSC films allowing depth resolved compositional analysis with nominally sub nm resolution. High resolution scanning electron microscopy images illustrate changes in surface morphology.

Journal or Publication Title: The Electrochemical Society
Volume: 35
Number: 1
Publisher: ECS
Divisions: 11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Nonmetallic-Inorganic Materials
11 Department of Materials and Earth Sciences
Date Deposited: 23 Jan 2017 07:12
Identification Number: doi:10.1149/1.3570187
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