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High accuracy terahertz time-domain system for reliable characterization of photoconducting antennas

Abdulmunem, Oday Mazin ; Born, Norman ; Mikulics, Martin ; Balzer, Jan Christof ; Koch, Martin ; Preu, Sascha :
High accuracy terahertz time-domain system for reliable characterization of photoconducting antennas.
[Online-Edition: http://onlinelibrary.wiley.com/doi/10.1002/mop.30322/full]
In: Microwave and Optical Technology Letters, 59 (2) pp. 468-472.
[Artikel], (2017)

Offizielle URL: http://onlinelibrary.wiley.com/doi/10.1002/mop.30322/full

Kurzbeschreibung (Abstract)

We report on a terahertz (THz) time-domain system to characterize photoconductive THz emitters and detectors, that is designed for highest reproducibility. This system is excellently suited for studying the performance of THz sources and detectors in a systematic manner, either by varying the substrate materials or the geometrical parameters of metallic antenna contacts building a photoconductive switch. After confirming the reproducibility and stability of the system with errors of only 1.9% (over 3 h) and 2.6% (over 9 days), we use the system to compare the performance of five low temperature grown (LT) GaAs wafers with growth temperatures between 200°C and 300°C.

Typ des Eintrags: Artikel
Erschienen: 2017
Autor(en): Abdulmunem, Oday Mazin ; Born, Norman ; Mikulics, Martin ; Balzer, Jan Christof ; Koch, Martin ; Preu, Sascha
Titel: High accuracy terahertz time-domain system for reliable characterization of photoconducting antennas
Sprache: Englisch
Kurzbeschreibung (Abstract):

We report on a terahertz (THz) time-domain system to characterize photoconductive THz emitters and detectors, that is designed for highest reproducibility. This system is excellently suited for studying the performance of THz sources and detectors in a systematic manner, either by varying the substrate materials or the geometrical parameters of metallic antenna contacts building a photoconductive switch. After confirming the reproducibility and stability of the system with errors of only 1.9% (over 3 h) and 2.6% (over 9 days), we use the system to compare the performance of five low temperature grown (LT) GaAs wafers with growth temperatures between 200°C and 300°C.

Titel der Zeitschrift, Zeitung oder Schriftenreihe: Microwave and Optical Technology Letters
Band: 59
(Heft-)Nummer: 2
Verlag: Wiley Online Library
Freie Schlagworte: photoconductive switch; terahertz; time domain spectroscopy
Fachbereich(e)/-gebiet(e): 18 Fachbereich Elektrotechnik und Informationstechnik > Institut für Mikrowellentechnik und Photonik > Terahertz Systems
18 Fachbereich Elektrotechnik und Informationstechnik > Institut für Mikrowellentechnik und Photonik
18 Fachbereich Elektrotechnik und Informationstechnik
Hinterlegungsdatum: 10 Feb 2017 18:34
Offizielle URL: http://onlinelibrary.wiley.com/doi/10.1002/mop.30322/full
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