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Wavelet methods for texture defect detection

Lambert, Georg and Bock, F. (1997):
Wavelet methods for texture defect detection.
3In: International Conference on Image Processing <1997, Santa Barbara, Calif.>: Proceedings., IEEE Signal Processing Soc. 1997,
IEEE Signal Processing Soc. 1997, IEEE Signal Processing Soc. 1997, In: International Conference on Image Processing, Santa Barbara, Californien, USA, pp. 201-204, [Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 1997
Creators: Lambert, Georg and Bock, F.
Title: Wavelet methods for texture defect detection
Language: English
Series Name: International Conference on Image Processing <1997, Santa Barbara, Calif.>: Proceedings.
Volume: 3
Place of Publication: IEEE Signal Processing Soc. 1997
Publisher: IEEE Signal Processing Soc. 1997
Edition: IEEE Signal Processing Soc. 1997
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Institut für Automatisierungstechnik und Mechatronik
18 Department of Electrical Engineering and Information Technology > Institut für Automatisierungstechnik und Mechatronik > Control Methods and Robotics
Event Title: International Conference on Image Processing
Event Location: Santa Barbara, Californien, USA
Date Deposited: 19 Nov 2008 16:04
License: [undefiniert]
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