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Band engineering for efficient catalyst-substrate coupling for photoelectrochemical water splitting

Klett, Joachim and Ziegler, Jürgen and Radetinac, Aldin and Kaiser, Bernhard and Schäfer, Rolf and Jaegermann, Wolfram and Urbain, Félix and Becker, Jan-Philipp and Smirnov, Vladimir and Finger, Friedhelm (2016):
Band engineering for efficient catalyst-substrate coupling for photoelectrochemical water splitting.
In: Phys. Chem. Chem. Phys., Royal Society of Chemistry, pp. 10751-10757, 18, (16), ISSN 1463-9076, [Online-Edition: http://dx.doi.org/10.1039/C5CP06230F],
[Article]

Abstract

To achieve an overall efficient solar water splitting device, not only the efficiencies of photo-converter and catalyst are decisive, but also their appropriate coupling must be considered. In this report we explore the origin of a voltage loss occurring at the interface between a thin film amorphous silicon tandem cell and the TiO2 corrosion protection layer by means of XPS. We find that the overall device can be disassembled into its primary constituents and that they can be analyzed separately, giving insight into the device structure as a whole. Thus, a series of model experiments were conducted, each representing a part of the complete device. We finally arrive at the conclusion, that the formation of a SiO2 interfacial layer between the TiO2 protection layer and the silicon cell gives rise to the voltage loss observed for the whole device.

Item Type: Article
Erschienen: 2016
Creators: Klett, Joachim and Ziegler, Jürgen and Radetinac, Aldin and Kaiser, Bernhard and Schäfer, Rolf and Jaegermann, Wolfram and Urbain, Félix and Becker, Jan-Philipp and Smirnov, Vladimir and Finger, Friedhelm
Title: Band engineering for efficient catalyst-substrate coupling for photoelectrochemical water splitting
Language: English
Abstract:

To achieve an overall efficient solar water splitting device, not only the efficiencies of photo-converter and catalyst are decisive, but also their appropriate coupling must be considered. In this report we explore the origin of a voltage loss occurring at the interface between a thin film amorphous silicon tandem cell and the TiO2 corrosion protection layer by means of XPS. We find that the overall device can be disassembled into its primary constituents and that they can be analyzed separately, giving insight into the device structure as a whole. Thus, a series of model experiments were conducted, each representing a part of the complete device. We finally arrive at the conclusion, that the formation of a SiO2 interfacial layer between the TiO2 protection layer and the silicon cell gives rise to the voltage loss observed for the whole device.

Journal or Publication Title: Phys. Chem. Chem. Phys.
Volume: 18
Number: 16
Publisher: Royal Society of Chemistry
Divisions: 11 Department of Materials and Earth Sciences > Material Science > Advanced Thin Film Technology
11 Department of Materials and Earth Sciences > Material Science > Surface Science
07 Department of Chemistry > Fachgebiet Anorganische Chemie
07 Department of Chemistry > Physical Chemistry
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences
07 Department of Chemistry
Date Deposited: 26 Apr 2016 09:22
Official URL: http://dx.doi.org/10.1039/C5CP06230F
Additional Information:

This article is part of themed collection: Bunsentagung 2016: Basic Mechanisms in Energy Conversion

Identification Number: doi:10.1039/C5CP06230F
Funders: Financial support of this project by the DFG priority program SPP 1613 as well as by the DFG Excellence Initiative, Darmstadt Graduate School of Energy Science and Engineering (GSC 1070) is gratefully acknowledged., A part of this work was financed by Evonik Industries AG, partially funded by the German Federal Ministry of Education and Research within the Project SusHy.
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