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Investigation of Transfer-free Catalytic CVD Graphene on SiO2 by Means of Conductive Atomic Force Microscopy

Noll, Dennis and Schwalke, Udo (2016):
Investigation of Transfer-free Catalytic CVD Graphene on SiO2 by Means of Conductive Atomic Force Microscopy.
In: 11th International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS), pp. 1-4, [Online-Edition: http://dx.doi.org/10.1109/DTIS.2016.7483899],
[Article]

Item Type: Article
Erschienen: 2016
Creators: Noll, Dennis and Schwalke, Udo
Title: Investigation of Transfer-free Catalytic CVD Graphene on SiO2 by Means of Conductive Atomic Force Microscopy
Language: English
Journal or Publication Title: 11th International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS)
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Institute for Semiconductor Technology and Nano-Electronics
Event Title: 11th International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS)
Event Location: Istanbul, Turkey
Event Dates: 12.-14.04.2016
Date Deposited: 19 Apr 2016 08:19
Official URL: http://dx.doi.org/10.1109/DTIS.2016.7483899
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