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Advanced Electromagnetic Field Analysis for High Quality Beams

Weiland, Thomas and Schuhmann, Rolf :
Advanced Electromagnetic Field Analysis for High Quality Beams.
In: International Journal of Applied Electromagnetics and Mechanics -Proceedings of the 10th International Symposium on Applied Electromagnetics and Mechanics.
[Conference or Workshop Item] , (2002)

Item Type: Conference or Workshop Item
Erschienen: 2002
Creators: Weiland, Thomas and Schuhmann, Rolf
Title: Advanced Electromagnetic Field Analysis for High Quality Beams
Language: English
Volume: 14
Number: 4
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Institute of Electromagnetic Field Theory
Event Title: International Journal of Applied Electromagnetics and Mechanics -Proceedings of the 10th International Symposium on Applied Electromagnetics and Mechanics
Date Deposited: 14 Mar 2016 16:41
Additional Information:

TEMF-Pub-DB TEMF000365

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