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Oxygen loss induced by swift heavy ions of low and high dE/dx in PMMA thin films

Thomaz, R. and Gutierres, L. I. and Morais, J. and Louette, P. and Severin, D. and Trautmann, C. and Pireaux, J. J. and Papaléo, R. M. (2015):
Oxygen loss induced by swift heavy ions of low and high dE/dx in PMMA thin films.
In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Elsevier Science BV, Netherlands, pp. 578-582, 365, ISSN 0168583X, [Online-Edition: http://dx.doi.org/10.1016/j.nimb.2015.09.019],
[Article]

Abstract

Investigations on the chemical modifications induced by swift heavy ions in PMMA thin films were carried out using beams of high dE/dx (2.2 GeV Bi, 14,090 eV/nm) and low dE/dx (2 MeV H, 19 eV/nm). The induced chemical modifications were monitored by XPS for films with initial thickness of 50 and 100 nm. For both beams, the irradiation decreased the amount of carbon atoms bound to oxygen (C=O and C-O-C), with a larger decrease of the carboxyl moiety, as expected. However, the chemical changes induced by light and heavy ions were qualitatively different. For the same mean deposited energy density, proton irradiation induced a decrease of the relative intensity of the carbon-oxygen bonds up to similar to 20% larger than the irradiation with Bi ions. This suggests a greater importance of particle ejection by unzipping of PMMA chains at high dE/dx, which tends to keep the O/C ratio closer to the pristine value. (C) 2015 Elsevier B.V. All rights reserved.

Item Type: Article
Erschienen: 2015
Creators: Thomaz, R. and Gutierres, L. I. and Morais, J. and Louette, P. and Severin, D. and Trautmann, C. and Pireaux, J. J. and Papaléo, R. M.
Title: Oxygen loss induced by swift heavy ions of low and high dE/dx in PMMA thin films
Language: English
Abstract:

Investigations on the chemical modifications induced by swift heavy ions in PMMA thin films were carried out using beams of high dE/dx (2.2 GeV Bi, 14,090 eV/nm) and low dE/dx (2 MeV H, 19 eV/nm). The induced chemical modifications were monitored by XPS for films with initial thickness of 50 and 100 nm. For both beams, the irradiation decreased the amount of carbon atoms bound to oxygen (C=O and C-O-C), with a larger decrease of the carboxyl moiety, as expected. However, the chemical changes induced by light and heavy ions were qualitatively different. For the same mean deposited energy density, proton irradiation induced a decrease of the relative intensity of the carbon-oxygen bonds up to similar to 20% larger than the irradiation with Bi ions. This suggests a greater importance of particle ejection by unzipping of PMMA chains at high dE/dx, which tends to keep the O/C ratio closer to the pristine value. (C) 2015 Elsevier B.V. All rights reserved.

Journal or Publication Title: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Volume: 365
Publisher: Elsevier Science BV, Netherlands
Uncontrolled Keywords: Polymer thin films, Ion irradiation, Chemical modifications, Depolymerization
Divisions: 11 Department of Materials and Earth Sciences > Material Science > Ion-Beam-Modified Materials
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences
Date Deposited: 29 Feb 2016 12:55
Official URL: http://dx.doi.org/10.1016/j.nimb.2015.09.019
Identification Number: doi:10.1016/j.nimb.2015.09.019
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