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Characterisation of reliability of compound semiconductor devices using electrical pulses

Brandt, Michael and Krozer, and Schüßler, and Bock, and Hartnagel, (1996):
Characterisation of reliability of compound semiconductor devices using electrical pulses.
In: Microelectronics and reliability. 36 (1996), S. 1891-1894, [Article]

Item Type: Article
Erschienen: 1996
Creators: Brandt, Michael and Krozer, and Schüßler, and Bock, and Hartnagel,
Title: Characterisation of reliability of compound semiconductor devices using electrical pulses
Language: English
Journal or Publication Title: Microelectronics and reliability. 36 (1996), S. 1891-1894
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Microwave Electronics
Date Deposited: 19 Nov 2008 16:03
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