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Quantitative Nanometer-Scale Mapping of Dielectric Tunability

Tselev, Alexander and Klein, Andreas and Gassmann, Jürgen and Jesse, Stephen and Li, Qian and Kalinin, Sergei V. and Balke, Nina (2015):
Quantitative Nanometer-Scale Mapping of Dielectric Tunability.
In: Advanced Materials Interfaces, p. 1500088, 2, (15), ISSN 21967350,
[Online-Edition: http://dx.doi.org/10.1002/admi.201500088],
[Article]

Abstract

Two scanning probe microscopy techniques—near-fi eld scanning microwave microscopy (SMM) and piezoresponse force microscopy (PFM)—are used to characterize and image tunability in a thin (Ba,Sr)TiO 3 film with nanometer scale spatial resolution. While sMIM allows direct probing of tunability by measurement of the change in the dielectric constant, in PFM, tunability can be extracted via electrostrictive response. The near-field microwave imaging and PFM provide similar information about dielectric tunability with PFM capable to deliver quantitative information on tunability with a higher spatial resolution close to 15 nm. This is the fi rst time, information about the dielectric tunability is available on such length scales.

Item Type: Article
Erschienen: 2015
Creators: Tselev, Alexander and Klein, Andreas and Gassmann, Jürgen and Jesse, Stephen and Li, Qian and Kalinin, Sergei V. and Balke, Nina
Title: Quantitative Nanometer-Scale Mapping of Dielectric Tunability
Language: English
Abstract:

Two scanning probe microscopy techniques—near-fi eld scanning microwave microscopy (SMM) and piezoresponse force microscopy (PFM)—are used to characterize and image tunability in a thin (Ba,Sr)TiO 3 film with nanometer scale spatial resolution. While sMIM allows direct probing of tunability by measurement of the change in the dielectric constant, in PFM, tunability can be extracted via electrostrictive response. The near-field microwave imaging and PFM provide similar information about dielectric tunability with PFM capable to deliver quantitative information on tunability with a higher spatial resolution close to 15 nm. This is the fi rst time, information about the dielectric tunability is available on such length scales.

Journal or Publication Title: Advanced Materials Interfaces
Volume: 2
Number: 15
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Surface Science
DFG-Collaborative Research Centres (incl. Transregio) > Collaborative Research Centres > CRC 595: Electrical fatigue
DFG-Collaborative Research Centres (incl. Transregio) > Collaborative Research Centres > CRC 595: Electrical fatigue > B - Characterisation
DFG-Collaborative Research Centres (incl. Transregio) > Collaborative Research Centres > CRC 595: Electrical fatigue > B - Characterisation > Subproject B7: Polarisation and charging in electrical fatigue ferroelectrics
Zentrale Einrichtungen
DFG-Collaborative Research Centres (incl. Transregio) > Collaborative Research Centres
DFG-Collaborative Research Centres (incl. Transregio)
Date Deposited: 15 Nov 2015 15:17
Official URL: http://dx.doi.org/10.1002/admi.201500088
Identification Number: doi:10.1002/admi.201500088
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