Tselev, Alexander ; Klein, Andreas ; Gassmann, Jürgen ; Jesse, Stephen ; Li, Qian ; Kalinin, Sergei V. ; Balke, Nina (2015):
Quantitative Nanometer-Scale Mapping of Dielectric Tunability.
In: Advanced Materials Interfaces, 2 (15), p. 1500088. ISSN 21967350,
[Article]
Abstract
Two scanning probe microscopy techniques—near-fi eld scanning microwave microscopy (SMM) and piezoresponse force microscopy (PFM)—are used to characterize and image tunability in a thin (Ba,Sr)TiO 3 film with nanometer scale spatial resolution. While sMIM allows direct probing of tunability by measurement of the change in the dielectric constant, in PFM, tunability can be extracted via electrostrictive response. The near-field microwave imaging and PFM provide similar information about dielectric tunability with PFM capable to deliver quantitative information on tunability with a higher spatial resolution close to 15 nm. This is the fi rst time, information about the dielectric tunability is available on such length scales.
| Item Type: | Article |
|---|---|
| Erschienen: | 2015 |
| Creators: | Tselev, Alexander ; Klein, Andreas ; Gassmann, Jürgen ; Jesse, Stephen ; Li, Qian ; Kalinin, Sergei V. ; Balke, Nina |
| Title: | Quantitative Nanometer-Scale Mapping of Dielectric Tunability |
| Language: | English |
| Abstract: | Two scanning probe microscopy techniques—near-fi eld scanning microwave microscopy (SMM) and piezoresponse force microscopy (PFM)—are used to characterize and image tunability in a thin (Ba,Sr)TiO 3 film with nanometer scale spatial resolution. While sMIM allows direct probing of tunability by measurement of the change in the dielectric constant, in PFM, tunability can be extracted via electrostrictive response. The near-field microwave imaging and PFM provide similar information about dielectric tunability with PFM capable to deliver quantitative information on tunability with a higher spatial resolution close to 15 nm. This is the fi rst time, information about the dielectric tunability is available on such length scales. |
| Journal or Publication Title: | Advanced Materials Interfaces |
| Journal volume: | 2 |
| Number: | 15 |
| Divisions: | 11 Department of Materials and Earth Sciences 11 Department of Materials and Earth Sciences > Material Science 11 Department of Materials and Earth Sciences > Material Science > Surface Science DFG-Collaborative Research Centres (incl. Transregio) > Collaborative Research Centres > CRC 595: Electrical fatigue DFG-Collaborative Research Centres (incl. Transregio) > Collaborative Research Centres > CRC 595: Electrical fatigue > B - Characterisation DFG-Collaborative Research Centres (incl. Transregio) > Collaborative Research Centres > CRC 595: Electrical fatigue > B - Characterisation > Subproject B7: Polarisation and charging in electrical fatigue ferroelectrics Zentrale Einrichtungen DFG-Collaborative Research Centres (incl. Transregio) > Collaborative Research Centres DFG-Collaborative Research Centres (incl. Transregio) |
| Date Deposited: | 15 Nov 2015 15:17 |
| Official URL: | http://dx.doi.org/10.1002/admi.201500088 |
| Identification Number: | doi:10.1002/admi.201500088 |
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