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Characterization of the Dielectric Breakdown Field Strength of PDMS Thin Films: Thickness Dependence and Electrode Shape

Förster-Zügel, Florentine and Grotepaß, Tanja and Schlaak, Helmut F. (2015):
Characterization of the Dielectric Breakdown Field Strength of PDMS Thin Films: Thickness Dependence and Electrode Shape.
9430, In: Proceedings of SPIE,
Smart Structures / NDE. Electroactive Polymer Actuators and Devices (EAPAD) 2015, San Diego, US, [Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 2015
Creators: Förster-Zügel, Florentine and Grotepaß, Tanja and Schlaak, Helmut F.
Title: Characterization of the Dielectric Breakdown Field Strength of PDMS Thin Films: Thickness Dependence and Electrode Shape
Language: English
Title of Book: Proceedings of SPIE
Volume: 9430
Divisions: 18 Department of Electrical Engineering and Information Technology > Microtechnology and Electromechanical Systems
18 Department of Electrical Engineering and Information Technology > Institute for Electromechanical Design (dissolved 18.12.2018)
18 Department of Electrical Engineering and Information Technology
Event Title: Smart Structures / NDE. Electroactive Polymer Actuators and Devices (EAPAD) 2015
Event Location: San Diego, US
Date Deposited: 03 Nov 2015 09:26
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