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Characterization of oriented thin films of WSe2 grown by van der Waals rheotaxy

Tenne, R. and Galun, E. and Ennaoui, A. and Fiechter, S. and Ellmer, K. and Kunst, M. and Koelzow, C. and Pettenkofer, C. and Tiefenbacher, S. and Scheer, R. and Jungblut, H. and Jaegermann, W. (1996):
Characterization of oriented thin films of WSe2 grown by van der Waals rheotaxy.
272, In: Thin Solid Films, (1), pp. 38-42, ISSN 00406090, [Online-Edition: http://dx.doi.org/10.1016/0040-6090(95)06963-1],
[Article]

Item Type: Article
Erschienen: 1996
Creators: Tenne, R. and Galun, E. and Ennaoui, A. and Fiechter, S. and Ellmer, K. and Kunst, M. and Koelzow, C. and Pettenkofer, C. and Tiefenbacher, S. and Scheer, R. and Jungblut, H. and Jaegermann, W.
Title: Characterization of oriented thin films of WSe2 grown by van der Waals rheotaxy
Language: English
Journal or Publication Title: Thin Solid Films
Volume: 272
Number: 1
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Surface Science
Date Deposited: 27 Apr 2015 08:08
Official URL: http://dx.doi.org/10.1016/0040-6090(95)06963-1
Identification Number: doi:10.1016/0040-6090(95)06963-1
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