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XPS analysis of the oxidation reaction of ruthenium-chalcogenide photoelectrodes

Jaegermann, W. and Kühne, H.-M. (1986):
XPS analysis of the oxidation reaction of ruthenium-chalcogenide photoelectrodes.
In: Applied Surface Science, 26 (1), pp. 1-11, ISSN 01694332,
[Online-Edition: http://dx.doi.org/10.1016/0169-4332(86)90048-6],
[Article]

Item Type: Article
Erschienen: 1986
Creators: Jaegermann, W. and Kühne, H.-M.
Title: XPS analysis of the oxidation reaction of ruthenium-chalcogenide photoelectrodes
Language: English
Journal or Publication Title: Applied Surface Science
Volume: 26
Number: 1
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Surface Science
Date Deposited: 22 Apr 2015 08:47
Official URL: http://dx.doi.org/10.1016/0169-4332(86)90048-6
Identification Number: doi:10.1016/0169-4332(86)90048-6
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