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Reactively magnetron sputtered Bi2O3 thin films: Analysis of structure, optoelectronic, interface, and photovoltaic properties

Morasch, Jan and Li, Shunyi and Broetz, Joachim and Jaegermann, Wolfram and Klein, Andreas (2014):
Reactively magnetron sputtered Bi2O3 thin films: Analysis of structure, optoelectronic, interface, and photovoltaic properties.
In: physica status solidi (a), WILEY-VCH Verlag GmbH & Co. KGaA, pp. 93-100, 211, (1), ISSN 18626300, [Online-Edition: http://dx.doi.org/10.1002/pssa.201330216],
[Article]

Abstract

Bi2O3 thin films deposited by RF magnetron sputtering have been studied in situ by using photoelectron spectroscopy. UV/VIS transmission spectroscopy and XRD measurements were carried out to determine the optical and structural properties of the films. Thin film solar cells were built up with ITO|Bi2O3|Au layer structures. These devices were characterized by current–voltage and capacitance–frequency measurements. Open-circuit voltages up to 680 mV and short-circuit current densities of about 0.3 mA cm−2 were observed. In addition, relative permittivities of approximately 45 have been measured. In order to determine the energy band alignment of Bi2O3 with different contact materials, interface experiments were carried out. With stepwise depositions of the contact material combined with in situ observation of the Fermi level shift via X-ray photoelectron spectroscopy, it is possible to measure the energy barrier height between a semiconductor and a metallic contact. The work functions of the different materials were determined by UV photoelectron spectroscopy.

Item Type: Article
Erschienen: 2014
Creators: Morasch, Jan and Li, Shunyi and Broetz, Joachim and Jaegermann, Wolfram and Klein, Andreas
Title: Reactively magnetron sputtered Bi2O3 thin films: Analysis of structure, optoelectronic, interface, and photovoltaic properties
Language: English
Abstract:

Bi2O3 thin films deposited by RF magnetron sputtering have been studied in situ by using photoelectron spectroscopy. UV/VIS transmission spectroscopy and XRD measurements were carried out to determine the optical and structural properties of the films. Thin film solar cells were built up with ITO|Bi2O3|Au layer structures. These devices were characterized by current–voltage and capacitance–frequency measurements. Open-circuit voltages up to 680 mV and short-circuit current densities of about 0.3 mA cm−2 were observed. In addition, relative permittivities of approximately 45 have been measured. In order to determine the energy band alignment of Bi2O3 with different contact materials, interface experiments were carried out. With stepwise depositions of the contact material combined with in situ observation of the Fermi level shift via X-ray photoelectron spectroscopy, it is possible to measure the energy barrier height between a semiconductor and a metallic contact. The work functions of the different materials were determined by UV photoelectron spectroscopy.

Journal or Publication Title: physica status solidi (a)
Volume: 211
Number: 1
Publisher: WILEY-VCH Verlag GmbH & Co. KGaA
Uncontrolled Keywords: Bi2O3, magnetron sputtering, photovoltaic properties, thin film
Divisions: 11 Department of Materials and Earth Sciences > Material Science > Surface Science
11 Department of Materials and Earth Sciences > Material Science > Structure Research
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences
Date Deposited: 27 Feb 2015 13:24
Official URL: http://dx.doi.org/10.1002/pssa.201330216
Identification Number: doi:10.1002/pssa.201330216
Funders: Funded by the German Science Foundation (DFG)
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