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Scaling Properties of the Dynamics of Semiconductor Lasers in External Cavities

Porte, X. and Soriano, M. C. and Breuer, S. and Drzewietzki, L. and Elsasser, W. and Fischer, I. (2014):
Scaling Properties of the Dynamics of Semiconductor Lasers in External Cavities.
In: 2014 International Semiconductor Laser Conference (ISLC), pp. 135-6, [Article]

Item Type: Article
Erschienen: 2014
Creators: Porte, X. and Soriano, M. C. and Breuer, S. and Drzewietzki, L. and Elsasser, W. and Fischer, I.
Title: Scaling Properties of the Dynamics of Semiconductor Lasers in External Cavities
Language: English
Journal or Publication Title: 2014 International Semiconductor Laser Conference (ISLC)
Divisions: Exzellenzinitiative
Exzellenzinitiative > Clusters of Excellence
Zentrale Einrichtungen
Exzellenzinitiative > Clusters of Excellence > Center of Smart Interfaces (CSI)
Date Deposited: 20 Jan 2015 16:03
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