Radetinac, Aldin ; Mani, Arzhang ; Melnyk, Sergiy ; Nikfalazar, Mohammad ; Ziegler, Jürgen ; Zheng, Yuliang ; Jakoby, Rolf ; Alff, Lambert ; Komissinskiy, Philipp (2014)
Highly conducting SrMoO3 thin films for microwave applications.
In: Applied Physics Letters, 105 (11)
doi: 10.1063/1.4896339
Artikel, Bibliographie
Kurzbeschreibung (Abstract)
We have measured the microwave resistance of highly conducting perovskite oxide SrMoO3 thin film coplanar waveguides. The epitaxial SrMoO3 thin films were grown by pulsed laser deposition and showed low mosaicity and smooth surfaces with a root mean square roughness below 0.3 nm. Layer-by-layer growth could be achieved for film thicknesses up to 400 nm as monitored by reflection high-energy electron diffraction and confirmed by X-ray diffraction. We obtained a constant microwave resistivity of 29 μΩ·cm between 0.1 and 20 GHz by refining the frequency dependence of the transmission coefficients. Our result shows that SrMoO3 is a viable candidate as a highly conducting electrode material for all-oxide microwave electronic devices.
| Typ des Eintrags: | Artikel |
|---|---|
| Erschienen: | 2014 |
| Autor(en): | Radetinac, Aldin ; Mani, Arzhang ; Melnyk, Sergiy ; Nikfalazar, Mohammad ; Ziegler, Jürgen ; Zheng, Yuliang ; Jakoby, Rolf ; Alff, Lambert ; Komissinskiy, Philipp |
| Art des Eintrags: | Bibliographie |
| Titel: | Highly conducting SrMoO3 thin films for microwave applications |
| Sprache: | Englisch |
| Publikationsjahr: | 19 September 2014 |
| Verlag: | AIP Publishing LLC |
| Titel der Zeitschrift, Zeitung oder Schriftenreihe: | Applied Physics Letters |
| Jahrgang/Volume einer Zeitschrift: | 105 |
| (Heft-)Nummer: | 11 |
| DOI: | 10.1063/1.4896339 |
| Kurzbeschreibung (Abstract): | We have measured the microwave resistance of highly conducting perovskite oxide SrMoO3 thin film coplanar waveguides. The epitaxial SrMoO3 thin films were grown by pulsed laser deposition and showed low mosaicity and smooth surfaces with a root mean square roughness below 0.3 nm. Layer-by-layer growth could be achieved for film thicknesses up to 400 nm as monitored by reflection high-energy electron diffraction and confirmed by X-ray diffraction. We obtained a constant microwave resistivity of 29 μΩ·cm between 0.1 and 20 GHz by refining the frequency dependence of the transmission coefficients. Our result shows that SrMoO3 is a viable candidate as a highly conducting electrode material for all-oxide microwave electronic devices. |
| Fachbereich(e)/-gebiet(e): | 11 Fachbereich Material- und Geowissenschaften 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Dünne Schichten 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Oberflächenforschung |
| Hinterlegungsdatum: | 17 Nov 2014 13:29 |
| Letzte Änderung: | 29 Mär 2015 17:39 |
| PPN: | |
| Sponsoren: | This work was supported by the Deutsche Forschungsgemeinschaft within KO 4093/1-1 and JA 921/31-1. |
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