Oron-Carl, Matti ; Krupke, Ralph (2013)
Enhancing Raman signals with an interferometrically controlled AFM tip.
In: Nanotechnology, 24 (41)
doi: 10.1088/0957-4484/24/41/415701
Artikel, Bibliographie
Kurzbeschreibung (Abstract)
We demonstrate the upgrade of a commercial confocal Raman microscope into a tip-enhanced Raman microscope/spectroscopy system (TERS) by integrating an interferometrically controlled atomic force microscope into the base of an existing upright microscope to provide near-field detection and thus signal enhancement. The feasibility of the system is demonstrated by measuring the Raman near-field enhancement on thin PEDOT:PSS films and on carbon nanotubes within a device geometry. An enhancement factor of 2–3 and of 5–6 is observed, respectively. Moreover, on a nanotube device we show local conductivity measurement and its correlation to Raman and topography recordings. Upgrading an existing upright confocal Raman microscope in the demonstrated way is significantly cheaper than purchasing a complete commercial TERS system.
| Typ des Eintrags: | Artikel |
|---|---|
| Erschienen: | 2013 |
| Autor(en): | Oron-Carl, Matti ; Krupke, Ralph |
| Art des Eintrags: | Bibliographie |
| Titel: | Enhancing Raman signals with an interferometrically controlled AFM tip |
| Sprache: | Englisch |
| Publikationsjahr: | 18 Oktober 2013 |
| Verlag: | IOP Publishing |
| Titel der Zeitschrift, Zeitung oder Schriftenreihe: | Nanotechnology |
| Jahrgang/Volume einer Zeitschrift: | 24 |
| (Heft-)Nummer: | 41 |
| DOI: | 10.1088/0957-4484/24/41/415701 |
| Kurzbeschreibung (Abstract): | We demonstrate the upgrade of a commercial confocal Raman microscope into a tip-enhanced Raman microscope/spectroscopy system (TERS) by integrating an interferometrically controlled atomic force microscope into the base of an existing upright microscope to provide near-field detection and thus signal enhancement. The feasibility of the system is demonstrated by measuring the Raman near-field enhancement on thin PEDOT:PSS films and on carbon nanotubes within a device geometry. An enhancement factor of 2–3 and of 5–6 is observed, respectively. Moreover, on a nanotube device we show local conductivity measurement and its correlation to Raman and topography recordings. Upgrading an existing upright confocal Raman microscope in the demonstrated way is significantly cheaper than purchasing a complete commercial TERS system. |
| Fachbereich(e)/-gebiet(e): | 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Fachgebiet Molekulare Nanostrukturen 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft 11 Fachbereich Material- und Geowissenschaften |
| Hinterlegungsdatum: | 06 Jun 2014 11:22 |
| Letzte Änderung: | 06 Jun 2014 11:22 |
| PPN: | |
| Sponsoren: | MOC thanks the German research foundation (DFG) for financial support through grant OR 262/1-2. |
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