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Reducing Feature Models to Improve Runtime Adaptivity on Resource Limited Devices

Saller, Karsten and Oster, Sebastian and Schürr, Andy and Schroeter, Julia and Lochau, Malte :
Reducing Feature Models to Improve Runtime Adaptivity on Resource Limited Devices.
[Online-Edition: http://dl.acm.org/citation.cfm?id=2364435]
In: Proceedings of the 16th International Software Product Line Conference, SPLC '12. ACM New York , USA
[Conference or Workshop Item] , (2013)

Official URL: http://dl.acm.org/citation.cfm?id=2364435
Item Type: Conference or Workshop Item
Erschienen: 2013
Creators: Saller, Karsten and Oster, Sebastian and Schürr, Andy and Schroeter, Julia and Lochau, Malte
Title: Reducing Feature Models to Improve Runtime Adaptivity on Resource Limited Devices
Language: English
Volume: 2
Place of Publication: USA
Publisher: ACM New York
Divisions: Zentrale Einrichtungen
DFG-Collaborative Research Centres (incl. Transregio) > Collaborative Research Centres > CRC 1053: MAKI – Multi-Mechanisms Adaptation for the Future Internet
DFG-Collaborative Research Centres (incl. Transregio) > Collaborative Research Centres > CRC 1053: MAKI – Multi-Mechanisms Adaptation for the Future Internet > B: Adaptation Mechanisms > Subpproject B1: Monitoring and Analysis
DFG-Collaborative Research Centres (incl. Transregio) > Collaborative Research Centres > CRC 1053: MAKI – Multi-Mechanisms Adaptation for the Future Internet > B: Adaptation Mechanisms
DFG-Collaborative Research Centres (incl. Transregio) > Collaborative Research Centres
DFG-Collaborative Research Centres (incl. Transregio)
Event Title: Proceedings of the 16th International Software Product Line Conference, SPLC '12
Date Deposited: 18 Feb 2014 15:36
Official URL: http://dl.acm.org/citation.cfm?id=2364435
Identification Number: MAKI-2012-003
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