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Diagnosing the Weakest Link in WSN Testbeds: A Reliability and Cost Analysis of the USB Backchannel

Guerrero, Pablo E. and Gurov, Iliya and Buchmann, Alejandro and Van Laerhoven, Kristof (2012):
Diagnosing the Weakest Link in WSN Testbeds: A Reliability and Cost Analysis of the USB Backchannel.
IEEE, In: 7th IEEE International Workshop on Practical Issues in Building Sensor Network Applications, [Conference or Workshop Item]

Abstract

This paper highlights and characterizes the main obstacle to deploying a robust wireless sensor network testbed: the USB connections that link each of the nodes via ethernet gateways to the central server. Unfortunately, these connections are also the

Item Type: Conference or Workshop Item
Erschienen: 2012
Creators: Guerrero, Pablo E. and Gurov, Iliya and Buchmann, Alejandro and Van Laerhoven, Kristof
Title: Diagnosing the Weakest Link in WSN Testbeds: A Reliability and Cost Analysis of the USB Backchannel
Language: English
Abstract:

This paper highlights and characterizes the main obstacle to deploying a robust wireless sensor network testbed: the USB connections that link each of the nodes via ethernet gateways to the central server. Unfortunately, these connections are also the

Publisher: IEEE
Uncontrolled Keywords: experimentation; testbeds; reliability; node reprogramming; universal serial bus
Divisions: 20 Department of Computer Science > Databases and Distributed Systems
20 Department of Computer Science
Event Title: 7th IEEE International Workshop on Practical Issues in Building Sensor Network Applications
Date Deposited: 03 Mar 2014 15:36
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