Sessler, Gerhard M. ; West, J. E. ; Seggern, H. von (1982)
Electron beam method for detecting charge distributions in thin Polyethyleneterephthalate films.
In: Journal of Applied Physics, 53 (6)
doi: 10.1063/1.331210
Artikel, Bibliographie
Kurzbeschreibung (Abstract)
An electron beam method is used to determine the spatial distribution of real and polarization charges in electroded 24‐μm Polyethyleneterphthalate@qL iephthalate films. The method consists of irradiating the samples with a monoenergetic electron beam whose energy is increased in steps. Evaluation of the currents from the nonirradiated electrode yields the charge distribution with a resolution of about 25% of the respective depth. Results for samples charged by electron beam in open circuit show relatively narrow distributions with a width corresponding to about half the maximum penetration depth.
| Typ des Eintrags: | Artikel |
|---|---|
| Erschienen: | 1982 |
| Autor(en): | Sessler, Gerhard M. ; West, J. E. ; Seggern, H. von |
| Art des Eintrags: | Bibliographie |
| Titel: | Electron beam method for detecting charge distributions in thin Polyethyleneterephthalate films |
| Sprache: | Englisch |
| Publikationsjahr: | Juni 1982 |
| Verlag: | American Institute of Physics Publishing |
| Titel der Zeitschrift, Zeitung oder Schriftenreihe: | Journal of Applied Physics |
| Jahrgang/Volume einer Zeitschrift: | 53 |
| (Heft-)Nummer: | 6 |
| DOI: | 10.1063/1.331210 |
| Kurzbeschreibung (Abstract): | An electron beam method is used to determine the spatial distribution of real and polarization charges in electroded 24‐μm Polyethyleneterphthalate@qL iephthalate films. The method consists of irradiating the samples with a monoenergetic electron beam whose energy is increased in steps. Evaluation of the currents from the nonirradiated electrode yields the charge distribution with a resolution of about 25% of the respective depth. Results for samples charged by electron beam in open circuit show relatively narrow distributions with a width corresponding to about half the maximum penetration depth. |
| Freie Schlagworte: | Films, Charge Distribution, Polyethylenes, Terphtalate, Electron Beams, Tickness, Experimental Data, Spatial Distribution, Polarization, Electrodes, Irradiation, Electric Currents, Resolution |
| Fachbereich(e)/-gebiet(e): | 11 Fachbereich Material- und Geowissenschaften 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Elektronische Materialeigenschaften |
| Hinterlegungsdatum: | 14 Jun 2013 10:55 |
| Letzte Änderung: | 13 Aug 2021 14:08 |
| PPN: | |
| Sponsoren: | The part of this work performed at the Technische Hochschule Darmstadt was supported by the Deutsche Forschungsgemeinschaft. |
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