Seggern, Heinz von (1979)
Identification of TSC peaks and surface-voltage stability in Teflon FEP.
In: Journal of Applied Physics, 50 (4)
doi: 10.1063/1.326193
Artikel, Bibliographie
Kurzbeschreibung (Abstract)
In this paper we examine the stability of corona‐ and electron‐beam‐charged 25‐μm FEP‐A in open circuit by using thermally stimulated (TSC) measurements. We show that electrets charged with electron beams of 10 keV or higher are more stable than corona‐charged foils. The inferior stability of corona‐charged samples is due to the filling of surface traps as opposed to volume traps in electron‐beam‐charged samples. A peak at 155 °C was attributed to surface traps located at a depth of 0–0.5 μm, while a peak at 170 °C is due to charge stored 0.5–1.8 μm beneath the nonmetallized surface. The volume traps yield a peak at 200 °C. The total volume trap density was estimated to 1.4×1014 traps/cm3.
| Typ des Eintrags: | Artikel |
|---|---|
| Erschienen: | 1979 |
| Autor(en): | Seggern, Heinz von |
| Art des Eintrags: | Bibliographie |
| Titel: | Identification of TSC peaks and surface-voltage stability in Teflon FEP |
| Sprache: | Englisch |
| Publikationsjahr: | 4 April 1979 |
| Verlag: | American Institute of Physics Publishing |
| Titel der Zeitschrift, Zeitung oder Schriftenreihe: | Journal of Applied Physics |
| Jahrgang/Volume einer Zeitschrift: | 50 |
| (Heft-)Nummer: | 4 |
| DOI: | 10.1063/1.326193 |
| Kurzbeschreibung (Abstract): | In this paper we examine the stability of corona‐ and electron‐beam‐charged 25‐μm FEP‐A in open circuit by using thermally stimulated (TSC) measurements. We show that electrets charged with electron beams of 10 keV or higher are more stable than corona‐charged foils. The inferior stability of corona‐charged samples is due to the filling of surface traps as opposed to volume traps in electron‐beam‐charged samples. A peak at 155 °C was attributed to surface traps located at a depth of 0–0.5 μm, while a peak at 170 °C is due to charge stored 0.5–1.8 μm beneath the nonmetallized surface. The volume traps yield a peak at 200 °C. The total volume trap density was estimated to 1.4×1014 traps/cm3. |
| Fachbereich(e)/-gebiet(e): | 11 Fachbereich Material- und Geowissenschaften 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft 11 Fachbereich Material- und Geowissenschaften > Materialwissenschaft > Elektronische Materialeigenschaften |
| Hinterlegungsdatum: | 13 Jun 2013 07:28 |
| Letzte Änderung: | 13 Aug 2021 14:08 |
| PPN: | |
| Sponsoren: | The author is grateful to the Deutsche Forschungsgemeinschaft for financial support of this work. |
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