Schwalke, Udo and Wessely, Frank and Krauss, Tillmann (2013):
Dopant-free CMOS on SOI: Multi-Gate Si-Nanowire Transistors for Logic and Memory Applications.
In: ECS Transactions, 53 (5), pp. 105-114. [Article]
Official URL: http://dx.doi.org/10.1149/05305.0105ecst
Item Type: | Article |
---|---|
Erschienen: | 2013 |
Creators: | Schwalke, Udo and Wessely, Frank and Krauss, Tillmann |
Title: | Dopant-free CMOS on SOI: Multi-Gate Si-Nanowire Transistors for Logic and Memory Applications |
Language: | English |
Journal or Publication Title: | ECS Transactions |
Journal volume: | 53 |
Number: | 5 |
Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Institute for Semiconductor Technology and Nano-Electronics |
Event Title: | 223rd Meeting of the Electrochemical Society |
Event Location: | Toronto, Ontario, Canada |
Event Dates: | 12.-16.05.2013 |
Date Deposited: | 21 May 2013 11:44 |
Official URL: | http://dx.doi.org/10.1149/05305.0105ecst |
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