TU Darmstadt / ULB / TUbiblio

Multi-CNTFETs for Power Device Applications: Investigation of CCVD Grown CNTs by Means of Atomic Force Microscopy

Keyn, Martin and Schwalke, Udo (2013):
Multi-CNTFETs for Power Device Applications: Investigation of CCVD Grown CNTs by Means of Atomic Force Microscopy.
In: 8th International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS), [Online-Edition: http://dx.doi.org/10.1109/DTIS.2013.6527767],
[Article]

Item Type: Article
Erschienen: 2013
Creators: Keyn, Martin and Schwalke, Udo
Title: Multi-CNTFETs for Power Device Applications: Investigation of CCVD Grown CNTs by Means of Atomic Force Microscopy
Language: English
Journal or Publication Title: 8th International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS)
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Institute for Semiconductor Technology and Nano-Electronics
Event Title: 8th International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS)
Event Location: Abu Dhabi, United Arab Emirates
Event Dates: 26.-28.03.2013
Date Deposited: 08 Apr 2013 12:52
Official URL: http://dx.doi.org/10.1109/DTIS.2013.6527767
Export:

Optionen (nur für Redakteure)

View Item View Item