TU Darmstadt / ULB / TUbiblio

A positron lifetime study of lanthanum and niobium doped Pb(Zr[sub 0.6]Ti[sub 0.4])O[sub 3]

Gottschalk, Sebastian and Hahn, Horst and Balogh, Adam G. and Puff, Werner and Kungl, Hans and Hoffmann, Michael J. (2004):
A positron lifetime study of lanthanum and niobium doped Pb(Zr[sub 0.6]Ti[sub 0.4])O[sub 3].
In: Journal of Applied Physics, American Institute of Physics, pp. 7464-7470, 96, (12), ISSN 00218979,
[Online-Edition: http://dx.doi.org/10.1063/1.1810198],
[Article]

Abstract

A study of vacancy-related defects in lanthanum and niobium doped PbZr0.6Ti0.4O3 with dopant concentrations of 0–6 and 0–4 mol%, respectively has been performed using positron annihilation spectroscopy X-ray diffraction, and photoelectron spectroscopy. Positron lifetime as well as coincidence annihilation radiation Doppler line broadening measurements were carried out. It was found that the samples exhibit vacancylike defects that act as positron traps. Two main defect lifetime components were found in both sample sets one at <150 ps and one at <300 ps. These defect trapping sites can be attributed to single oxygen vacancies and A-site vacancies, respectively. Doppler line broadening measurements, however, do not show significant changes as a function of dopant concentrations in terms of shape S and wing W parameters.

Item Type: Article
Erschienen: 2004
Creators: Gottschalk, Sebastian and Hahn, Horst and Balogh, Adam G. and Puff, Werner and Kungl, Hans and Hoffmann, Michael J.
Title: A positron lifetime study of lanthanum and niobium doped Pb(Zr[sub 0.6]Ti[sub 0.4])O[sub 3]
Language: English
Abstract:

A study of vacancy-related defects in lanthanum and niobium doped PbZr0.6Ti0.4O3 with dopant concentrations of 0–6 and 0–4 mol%, respectively has been performed using positron annihilation spectroscopy X-ray diffraction, and photoelectron spectroscopy. Positron lifetime as well as coincidence annihilation radiation Doppler line broadening measurements were carried out. It was found that the samples exhibit vacancylike defects that act as positron traps. Two main defect lifetime components were found in both sample sets one at <150 ps and one at <300 ps. These defect trapping sites can be attributed to single oxygen vacancies and A-site vacancies, respectively. Doppler line broadening measurements, however, do not show significant changes as a function of dopant concentrations in terms of shape S and wing W parameters.

Journal or Publication Title: Journal of Applied Physics
Volume: 96
Number: 12
Publisher: American Institute of Physics
Uncontrolled Keywords: lead compounds, lanthanum, niobium, ferroelectric materials, positron annihilation, impurity-vacancy interactions, vacancies (crystal), impurity distribution, Doppler broadening, sintering, X-ray photoelectron spectra, X-ray diffraction
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Material Analytics
11 Department of Materials and Earth Sciences > Material Science > Joint Research Laboratory Nanomaterials
DFG-Collaborative Research Centres (incl. Transregio)
DFG-Collaborative Research Centres (incl. Transregio) > Collaborative Research Centres
Zentrale Einrichtungen
DFG-Collaborative Research Centres (incl. Transregio) > Collaborative Research Centres > CRC 595: Electrical fatigue
DFG-Collaborative Research Centres (incl. Transregio) > Collaborative Research Centres > CRC 595: Electrical fatigue > A - Synthesis
DFG-Collaborative Research Centres (incl. Transregio) > Collaborative Research Centres > CRC 595: Electrical fatigue > A - Synthesis > Subproject A2: Manufacturing and characterization of PZT-ceramics with defined defect chemistry
DFG-Collaborative Research Centres (incl. Transregio) > Collaborative Research Centres > CRC 595: Electrical fatigue > B - Characterisation
DFG-Collaborative Research Centres (incl. Transregio) > Collaborative Research Centres > CRC 595: Electrical fatigue > B - Characterisation > Subproject B2: Investigations of the defect structure and diffusion in ferroelectric materials
Date Deposited: 08 Feb 2013 08:20
Official URL: http://dx.doi.org/10.1063/1.1810198
Additional Information:

SFB 595 (Electric Fatigue In Functional Materials)

Identification Number: doi:10.1063/1.1810198
Funders: The authors gratefully acknowledge the financial support by German Research Foundation (DFG) within the frame of the Center of Excellence SFB 595 (Electric Fatigue In Functional Materials) Project.
Export:

Optionen (nur für Redakteure)

View Item View Item