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Imaging Properties of Scintillation Screens for High Energetic Ion Beams

Renuka, K. and Becker, F. and Ensinger, Wolfgang and Forck, P. and Haseitl, R. and Walasek-Hohne, B. (2012):
Imaging Properties of Scintillation Screens for High Energetic Ion Beams.
59, In: IEEE Transactions on Nuclear Science, (5), pp. 2301 -2306. IEEE Nuclear and Plasma Sciences Society, [Article]

Abstract

The imaging properties of various scintillation screens were investigated for ion beams extracted from the heavy ion synchrotron SIS 18 at GSI. Different ion beams such as C, Ne, Ar, Ta and U with initial kinetic energy of about 300 MeV/u were applied to various scintillation screens with particle fluxes ranging from 104 to 109 particles per pulse typically within 0.3 s pulse length. The scintillation process was observed with a digital Charge Coupled Device (CCD) camera. The performed study compares the light output, the beam profiles, and the image deformation of various scintillating screens for different ion beams. The light output scales linearly with respect to the ion beam flux over five orders of magnitude for the sensitive scintillation screens and ceramics like Al2 O3 , Al2 O3:Cr. The highest light output was observed for CsI:Tl, and the lowest was recorded for Herasil. At higher beam intensities, non linear behavior of light output was observed for Mg and Y doped ZrO2 samples. The recorded beam profiles showed differences in width up to 50%, depending on the screen material.

Item Type: Article
Erschienen: 2012
Creators: Renuka, K. and Becker, F. and Ensinger, Wolfgang and Forck, P. and Haseitl, R. and Walasek-Hohne, B.
Title: Imaging Properties of Scintillation Screens for High Energetic Ion Beams
Language: English
Abstract:

The imaging properties of various scintillation screens were investigated for ion beams extracted from the heavy ion synchrotron SIS 18 at GSI. Different ion beams such as C, Ne, Ar, Ta and U with initial kinetic energy of about 300 MeV/u were applied to various scintillation screens with particle fluxes ranging from 104 to 109 particles per pulse typically within 0.3 s pulse length. The scintillation process was observed with a digital Charge Coupled Device (CCD) camera. The performed study compares the light output, the beam profiles, and the image deformation of various scintillating screens for different ion beams. The light output scales linearly with respect to the ion beam flux over five orders of magnitude for the sensitive scintillation screens and ceramics like Al2 O3 , Al2 O3:Cr. The highest light output was observed for CsI:Tl, and the lowest was recorded for Herasil. At higher beam intensities, non linear behavior of light output was observed for Mg and Y doped ZrO2 samples. The recorded beam profiles showed differences in width up to 50%, depending on the screen material.

Journal or Publication Title: IEEE Transactions on Nuclear Science
Volume: 59
Number: 5
Publisher: IEEE Nuclear and Plasma Sciences Society
Uncontrolled Keywords: Bioengineering ; Communication, Networking & Broadcasting ; Components, Circuits, Devices & Systems ; Engineered Materials, Dielectrics & Plasmas ; Engineering Profession ; Fields, Waves & Electromagnetics ; General Topics for Engineers (Math, Science & Engineering) ; Nuclear Engineering
Divisions: 11 Department of Materials and Earth Sciences > Material Science > Material Analytics
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences
Date Deposited: 11 Oct 2012 11:13
Funders: Sponsored by IEEE Nuclear and Plasma Sciences Society
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