Kim, Chang Hwan Peter and Bodden, Eric and Batory, Don and Khurshid, Sarfraz (2010):
Reducing Configurations to Monitor in a Software Product Line.
In: LNCS, 6418, pp. 285-299, Springer, 1st International Conference on Runtime Verification (RV), [Conference or Workshop Item]
Official URL: http://www.bodden.de/pubs/kbbk10reducing.pdf
Item Type: | Conference or Workshop Item |
---|---|
Erschienen: | 2010 |
Creators: | Kim, Chang Hwan Peter and Bodden, Eric and Batory, Don and Khurshid, Sarfraz |
Title: | Reducing Configurations to Monitor in a Software Product Line |
Language: | English |
Series Name: | LNCS |
Volume: | 6418 |
Publisher: | Springer |
Uncontrolled Keywords: | clara |
Divisions: | 20 Department of Computer Science > Software Technology LOEWE > LOEWE-Zentren > CASED – Center for Advanced Security Research Darmstadt 20 Department of Computer Science > EC SPRIDE 20 Department of Computer Science > EC SPRIDE > Secure Software Engineering 20 Department of Computer Science Zentrale Einrichtungen LOEWE LOEWE > LOEWE-Zentren |
Event Title: | 1st International Conference on Runtime Verification (RV) |
Date Deposited: | 28 Sep 2012 11:09 |
Official URL: | http://www.bodden.de/pubs/kbbk10reducing.pdf |
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