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Reducing Configurations to Monitor in a Software Product Line

Kim, Chang Hwan Peter and Bodden, Eric and Batory, Don and Khurshid, Sarfraz (2010):
Reducing Configurations to Monitor in a Software Product Line.
Springer, In: 1st International Conference on Runtime Verification (RV), In: LNCS, [Online-Edition: http://www.bodden.de/pubs/kbbk10reducing.pdf],
[Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 2010
Creators: Kim, Chang Hwan Peter and Bodden, Eric and Batory, Don and Khurshid, Sarfraz
Title: Reducing Configurations to Monitor in a Software Product Line
Language: English
Series Name: LNCS
Volume: 6418
Publisher: Springer
Uncontrolled Keywords: clara
Divisions: 20 Department of Computer Science > Software Technology
LOEWE > LOEWE-Zentren > CASED – Center for Advanced Security Research Darmstadt
20 Department of Computer Science > EC SPRIDE
20 Department of Computer Science > EC SPRIDE > Secure Software Engineering
20 Department of Computer Science
Zentrale Einrichtungen
LOEWE
LOEWE > LOEWE-Zentren
Event Title: 1st International Conference on Runtime Verification (RV)
Date Deposited: 28 Sep 2012 11:09
Official URL: http://www.bodden.de/pubs/kbbk10reducing.pdf
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