Kim, Chang Hwan Peter and Bodden, Eric and Batory, Don and Khurshid, Sarfraz (2010):
Reducing Configurations to Monitor in a Software Product Line.
6418In: LNCS, Springer, In: 1st International Conference on Runtime Verification (RV), pp. 285-299, [Online-Edition: http://www.bodden.de/pubs/kbbk10reducing.pdf],
[Conference or Workshop Item]
Official URL: http://www.bodden.de/pubs/kbbk10reducing.pdf
| Item Type: | Conference or Workshop Item |
|---|---|
| Erschienen: | 2010 |
| Creators: | Kim, Chang Hwan Peter and Bodden, Eric and Batory, Don and Khurshid, Sarfraz |
| Title: | Reducing Configurations to Monitor in a Software Product Line |
| Language: | English |
| Series Name: | LNCS |
| Volume: | 6418 |
| Publisher: | Springer |
| Uncontrolled Keywords: | clara |
| Divisions: | 20 Department of Computer Science > Software Technology LOEWE > LOEWE-Zentren > CASED – Center for Advanced Security Research Darmstadt 20 Department of Computer Science > EC SPRIDE 20 Department of Computer Science > EC SPRIDE > Secure Software Engineering 20 Department of Computer Science Zentrale Einrichtungen LOEWE LOEWE > LOEWE-Zentren |
| Event Title: | 1st International Conference on Runtime Verification (RV) |
| Date Deposited: | 28 Sep 2012 11:09 |
| Official URL: | http://www.bodden.de/pubs/kbbk10reducing.pdf |
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